AMES, Iowa – Materials engineers don’t like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms generally degrades performance of electrical ...

From tensile strength measurements to atomic defect mapping, materials testing is entering a new era powered by AI, automation, and advanced imaging. Researchers are now using machine learning, ...

Scientists have discovered that a "single atomic defect" in a layered 2D material can hold onto quantum information for microseconds at room temperature, underscoring the potential of 2D materials in ...

BERKELEY, Calif. — In a study at Lawrence Berkeley National Laboratory (LBNL), exposing certain thermoelectric materials to alpha-particle radiation has been shown to transform the materials into far ...

Defects such as cracks in a material are responsible for everything from malfunctioning microchips to earthquakes. Now MIT engineers have developed a model to predict a defect's birthplace, its ...

Topological defects in liquid crystals guide the self-assembly of molecular amphiphiles. Abbott and co-workers' study raises questions about the nature of the defect core and the topology of the ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Researchers have discovered that engineering one-dimensional line defects into certain materials can increase their electrical performance. Materials engineers don't like to see line defects in ...