Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory ...

Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...

Keithley Instruments has announced the publication of Parallel Test Technology: The New Paradigm for Parametric Testing, a handbook that covers semiconductor parametric testing. The free, 60-page book ...

Available with up to 48 pins and eight source-measurement units, the next-generation 4080 Series parametric test platform from Agilent Technologies features resolution to 1 femtoamp and 0.1 microvolt.

For example, an application mutant can be created in part by changing an “and” logical operator in a line of code to an “or” logical operator. The suite of test cases can then be executed against the ...