To establish standardised protocols for vision screening, testability and comparability of three different vision tests were examined in a population-based, cross-sectional sample of preschool ...

本系列翻译自印度工程师，点击原文链接即可查看。 如今，半导体是整个电子行业不断发展的核心。新技术的发展，尤其是先进技术节点，如7nm及以下工艺，使集成电路行业能够跟上消费者不断增长的性能需求，也即摩尔定律得到延续，毫不夸张的说，集成电路 ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Vivek Yadav, an engineering manager from ...

A monthly overview of things you need to know as an architect or aspiring architect. Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with ...

The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a "test re-use" strategy ...

The complexity of system-on-chip (SoC) designs continues to grow, so the corresponding design-for-test (DFT) logic required for manufacturing has become more advanced. Design teams are challenged by ...

JTAG has its place but it is not by any means the total solution. Boundary scan, as standardized by IEEE 1149.1 and commonly referred to as JTAG, has truly revolutionized the testability of circuit ...

Atrenta's SpyGlass DFT, an addition to its SpyGlass predictive-analysis tool, helps designers identify at the register transfer level (RTL) testability issues that would normally appear only at the ...