Abstract: Non-destructive analyzing tools are needed at all stages of thin film process-development, especially photovoltaic (PV) development, and on production lines. In the case of thin films, layer ...

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Abstract: Depositing ultra-thin metallic films with an accurate control of the film properties (like film thickness, surface roughness and electrical properties) both in the initial and in the ...

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Czech Advanced Technology and Research Institute, Regional Centre of Advanced Technologies and Materials, Palacký University Olomouc, Šlechtitelů 27, 77900 Olomouc, Czech Republic ...

School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, People’s Republic of China ...