IEEE

Post-Irradiation Fault Injection for Complex FPGA Designs

Abstract: Fault injection is a widely used method of assessing the reliability of field-programmable gate array (FPGA) designs operating in harsh radiation environments. While typically conducted ...
IEEE

Design and development of FPGA Architecture for Low-Power UART for Smart Homes

Abstract: This research paper delves into the design and development of a Field-Programmable Gate Array (FPGA) architecture specifically engineered for low-power UART (Universal Asynchronous ...